Test system having a sub-system to sub-system bridge

ABSTRACT

A test system having a sub-system to sub-system bridge may be provided that utilizes the useful attributes of a plurality of circuit testing techniques, while reducing deficiencies associated with certain types of circuit testing. A bridged test system structure is utilized to facilitate circuit testing that is more effective and time efficient. The method analyzes performance data acquired by a first component for one or more circuits, and sends that performance data to a second test component. The second test component provides test signals to the circuits, using the performance date to enhance the use of the test signals, and also provides test response data for the circuits in response to the provided test signals.

CROSS REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. application Ser. No.11/944,855, filed Nov. 26, 2007, now U.S. Pat. No. 8,230,278, theentirety of which is incorporated herein by reference.

BACKGROUND

A test system having a sub-system to sub-system bridge is a system fortroubleshooting circuits. When troubleshooting circuits in atelecommunications network, for example, testing circuit functionalitymay occur using a passive circuit test, or by injecting a test signalinto the circuit (active testing), or any other form of circuit testing.However, these forms of circuit testing each have deficiencies introubleshooting and diagnosing circuits in a network. For example, whenpassively testing a circuit, circuit telemetry, e.g. circuit fault andalarm data sent by the circuit, test signals are input into the circuitto determine circuit responsiveness. Also, a passive circuit test failsto sectionalize a circuit under test causing difficulty in pinpointingcircuit problems. Actively testing a circuit may fail to touch adesignated element with the circuit because such testing cannot loop allrequested test points within the circuit. Also, active testing cannot beused on all circuit elements and may not have a point of reference fortesting a circuit, because a technician may not have an indication ofwhere the circuit is operating incorrectly.

SUMMARY

A test system having a sub-system to sub-system bridge is provided, andembodiments of the present invention include a method for circuittesting. The method analyzes performance data for one or morepredetermined circuits acquired by a first test component. The methodsends the performance data for the one or more predetermined circuits toa second test component. The method provides test signals to the one ormore predetermined circuits, using the performance data to enhance theuse of the test signals. The method also obtains test response data forthe one or more predetermined circuits in response to the provided testsignals. The method determines if the one or more predetermined circuitsare operating correctly.

Embodiments of the present invention include a computer-readable mediumstoring a set of instructions that, when executed, performs a method forcircuit testing. The computer-readable medium obtains performance datafor one or more predetermined circuits acquired by a first testcomponent. The computer-readable medium sends the performance data forthe one or more predetermined circuits to a second test component. Thecomputer-readable medium maps a circuit layout for the one or morepredetermined circuit using the second test component. Thecomputer-readable medium provides test signals to the one or morepredetermined circuits using the performance data to enhance the use ofthe test signals. The computer-readable medium obtains test responsedata for the one or more predetermined circuits in response to theprovided test signals. The computer-readable medium also determines ifthe one or more predetermined circuits is operating correctly.

Embodiments of the present invention include a system for circuittesting. The system may include a passive circuit test sub-system topassively test one or more predetermined circuits, and may include anactive circuit test sub-system for actively testing the one or morepredetermined circuits. The system may include a test system bridge fortransmitting data from the passive circuit test sub-system to the activecircuit test sub-system. The system may include a circuittroubleshooting application to perform circuit testing on the one ormore predetermined circuits using the passive circuit test sub-systemand active circuit test sub-system.

Other systems, methods, and/or computer program products according toembodiments will be or become apparent to one with skill in the art uponreview of the following drawings and detailed description. It isintended that all such additional systems, methods, and/or computerprogram products be included within this description, be within thescope of the present invention, and be protected by the accompanyingclaims.

BRIEF DESCRIPTION OF THE DRAWINGS

The accompanying drawings, which are incorporated in and constitute apart of this disclosure, illustrate various embodiments of the presentinvention. In the drawings:

FIG. 1 illustrates a communications network consistent with anembodiment of the invention;

FIG. 2 illustrates a networked operating environment where embodimentsof the invention may be practiced;

FIG. 3 is a block diagram of a system including a computing device forimplementing an embodiment of the invention;

FIG. 4 is a communications circuit consistent with an embodiment of theinvention;

FIG. 5 is an exemplary test system consistent with an embodiment of theinvention; and

FIG. 6 is a flow diagram according to an embodiment of the presentinvention.

DETAILED DESCRIPTION

The following detailed description refers to the accompanying drawings.Wherever possible, the same reference numbers are used in the drawingsand the following description to refer to the same or similar elements.While embodiments of the invention may be described, modifications,adaptations, and other implementations are possible. For example,substitutions, additions, or modifications may be made to the elementsillustrated in the drawings, and the methods described herein may bemodified by substituting, reordering, or adding stages to the disclosedmethods. Accordingly, the following detailed description does not limitthe invention. Instead, the proper scope of the invention is defined bythe appended claims.

A test system having a sub-system to sub-system bridge may be provided.Consistent with embodiments of the present invention, a method, system,and computer readable medium for circuit testing is disclosed. Often,when attempting to troubleshoot a circuit, many different methods may beemployed. However, each troubleshooting technique includes certaintesting deficiencies, thereby providing an incomplete assessment ofcircuit functionality or lack thereof. Accordingly, a system thatutilizes the useful attributes of a plurality of circuit testingtechniques, while reducing deficiencies associated with certain types ofcircuit testing, is desired. Therefore, a bridged test system structureas embodied herein may be utilized to facilitate circuit testing that ismore effective and time efficient.

An embodiment consistent with the invention includes a system forcircuit testing. The system obtains performance data for one or morepredetermined circuits acquired by a first test component, and sends theperformance data for the one or more predetermined circuits to a secondtest component. The system maps a circuit layout for the one or morepredetermined circuits using the second test component, and providestest signals to the one or more predetermined circuits using theperformance data to enhance the use of the test signals. The systemobtains test response data for the one or more predetermined circuits inresponse to the provided test signals. The system also determines if theone or more predetermined circuits are operating correctly. By utilizingperformance data acquiring through passive testing of a circuit beingtested prior to actively testing the circuit, additional circuit historyinformation, performance data, and additional circuit test points may beutilized to create a more complete assessment of circuit functionality.

FIG. 1 illustrates a communications network 100 in which circuit testingmay occur. The communications network 100 includes customer premisesequipment (CPE) 102 having a computer 106 and a voice-enabledtransceiver 108 in communication with the computer 106 via link 110. Thelink 110 may represent wireline or wireless communication between thecomputer 106 and the voice-enabled transceiver 108. The voice-enabledtransceiver 108 is in communication with the link 110 via link 111,which may be, for example, an RJ-11 connection.

The communications network 100 includes a central office (CO) 104, whichis in communication with the CPE 102 via a copper wire pair 112. The CO104 may be connected to additional COs, or to an Inter-Exchange Carrier(IEC). The CPE 102 may provide dial-up access to network 128 or, morecommonly, may provide a digital subscriber line (DSL) connection or anyother communications medium. The copper wire pair 112 is connected tothe internal wiring of the user's premises through a network interfacedevice (NID) 114. As shown in FIG. 1, the CO 104 includes a subscriberline multiplexer 116 in communication with the copper wire pair 112. Itwill be appreciated that multiple copper wire pairs may be incommunication with the subscriber line multiplexer 116. According to anembodiment of the invention, the subscriber line multiplexer 116 mayinclude at least one subscriber line card (SLC) 118 for interfacing witha user's (subscriber) line. The subscriber line multiplexer 116 may alsoinclude a voice control card (VCC) 120 for aggregation package switchingand a plurality of transceiving devices 122, 124, 126 . . . n.

The subscriber line multiplexer 116 may be in communication with thenetwork 128, such as an asynchronous transfer mode (ATM) network, vialink 130. Link 130 may be any link, such as an optical carrier link orT-3 (DS-3) line, operable to transport signals between the subscriberline multiplexer 116 and the network 128. A network service provider(NSP) server 136 may communicate with a broadband gateway (BBG) 138. TheBBG 138 provides other services to users of the communications network100, such as multiple sessions, more security, or enhanced aggregation.The NSP server 136 enables a user to connect to a network, such as theInternet.

A voice gateway server (VGS) 132 may also communicate with the network128 and recognize protocols having a specific header attached by thevoice-enabled transceiver 108. The VGS 132 may be described as a generalpurpose computing system having components including an operatingsystem, a processor and memory space as described below for computingdevice 300 illustrated and described with reference to FIG. 3. The VGS132 also includes a server key word identifier (KWI) application 134operable to recognize the packetized instructions transmitted from theCPE 102 and retrieve information, such as a web link, web page, and/orIP addresses, from the network 128. The VGS 132 may attach a destinationaddress, such as a uniform resource locator (URL) and/or Internetprotocol (IP) address to a signal before transmitting the modifiedsignal back to the CPE 102. The VGS 132 may also perform a similarfunction as if a user typed in a URL or IP address at the CPE 102.

However, the VGS 132, using the KWI application 134, may recognizecommands input as voice commands at the voice-enabled transceiver 108 ofthe CPE 102 and convert those commands to protocol signals recognizableby the NSP server 136. The KWI application 134 of the VGS 132 mayrecognize key terms associated with user requested information, such asrequested web links for example, and requests the information from thenetwork 128 using known protocols, such as TCP/IP, UDP, etc.Information, such as a web page, link, or other information may betransmitted to the CPE 102, based upon the user's voice commands.

The communications network 100 also includes an element managementsystem (EMS) 140 in communication with the network 128. The EMS 140provides maintenance and provisioning capability. The EMS 140 mayutilize a graphical user interface to allow an administrator to monitoran element by viewing traffic being passed on a given port of theelement, and ensuring the traffic flow through the element.

Referring to FIG. 2, a system 200 is illustrated where exemplaryembodiments may be implemented. System 200 interacts with thecommunications network 100 shown in FIG. 1 using, for example, thenetwork 128. System 200 may comprise any topology of servers, clients,Internet service providers, and communication media. Also, system 200may have a static or dynamic topology. The term “client” may refer to aclient application or a client device employed by a user to performbusiness logic operations. Computing devices within system 200 may useone or more programs or a server machine executing programs associatedwith managing one or more business controls. Both clients andapplication servers may be embodied as a single device (or program) or anumber of devices (programs). Similarly, data sources may include one ormore data stores, input devices, and the like.

A circuit troubleshooting application 320, described in more detailbelow with reference to FIG. 3, may be run centrally on a server 202(FIG. 2) at, for example CO 104, or in a distributed manner over severalservers and/or client devices. For example, server 202 may be a webserver which can utilize hypertext markup language (HTML), JAVA Script,and Microsoft® AST, and the like. A number of other applications mayalso be configured, deployed, and shared in system 100. In addition, thecircuit troubleshooting application 320 may also be run in one or moreclient devices and information exchanged over network 128.

Data store 212 is an example of a number of data stores that may beutilized to store copies of the data acquired during circuit testingaccording to the disclosed embodiment. Data store 212 may be managed bydata storage server 204 or directly accessed by server 202 or any one ofthe clients. Various types of data may be created, edited and processedwhen troubleshooting circuits.

Users may interact with server 202 by running the circuittroubleshooting application 320 from client devices 222, 224, 226, and228 over network 128. In one embodiment, portions or all of the circuittroubleshooting application 320 may reside on any one or all of theclient devices 222, 224, 226, and 228. In such an embodiment, data maybe stored in data store 212 without involvement of server 202.

Network 128 may include a secure network such as an enterprise network,or an unsecure network such as a wireless open network. Network 128 mayprovide communication between the nodes described above. By way ofexample, and not limitation, network 128 may include wired media such asa wired network or direct-wired connection, and wireless media such asacoustic, RF, infrared and other wireless media.

Many other configurations of computing devices, applications, and datastorage may be employed to implement the system 200.

With reference to FIG. 3, one example of the system 200 for implementingthe embodiments includes a computing device, such as computing device300, which may reside on one or more servers, clients, Internet serviceproviders, and communication media within the system 200. Computingdevice 300 typically includes a main processing unit 302 and systemmemory 304. The system memory 304 may be volatile (such as RAM),non-volatile (such as ROM, flash memory, etc.) or some combination ofthe two. System memory 304 typically provides an environment for anoperating system 306 to be executed for controlling the operation ofcomputing device 300 and execution of other programs (applications).Software applications 308 and circuit troubleshooting application 320are examples of programs or program modules that may be executed underthe control of operating system 306 in system memory 304. Additionaloperating systems or programs may also be executed within system memory304 outside the control of operating system 306. Circuit troubleshootingapplication 320 enables a user to test circuit functionality for acircuit, e.g. a circuit within communications network 100.

Troubleshooting circuit application 320 may be an integrated part of afile management application or a separate application. Troubleshootingcircuit application 320 may communicate with other applications runningon computing device 300 or on other devices. Furthermore,troubleshooting circuit application 320 may be executed in an operatingsystem other than operating system 306.

The computing device 300 may have additional features or functionality.For example, the computing device 300 may also include data storagedevices 310 (removable and/or non-removable) such as, for example,magnetic disks, optical disks, or tape. Computer storage media mayinclude volatile and nonvolatile, removable and non-removable mediaimplemented in any method or technology for storage of information, suchas computer readable instructions, data structures, program modules, orother data. System memory 304 and storage devices 310 are examples ofcomputer storage media. Computer storage media includes, but is notlimited to, RAM, ROM, EEPROM, flash memory or other memory technology,CD-ROM, digital versatile disks (DVD) or other optical storage, magneticcassettes, magnetic tape, magnetic disk storage or other magneticstorage devices, or any other medium which can be used to store thedesired information and which can be accessed by computing device 300.Any such computer storage media may be part of device 300.

Computing device 300 may also include input device(s) 312 such as akeyboard, a mouse, a pen, a voice input device, a touch input device,etc. Furthermore, output device(s) 314 such as a display, a speaker, aprinter, etc. may also be included.

Communication connections 316 may be included in computing device 300 toallow the device to communicate with other computing devices 318, suchas over the network 128, in a distributed computing environment, forexample, an intranet or the Internet. Communication connection 316exemplifies various communication media. Communication media may beembodied by computer readable instructions, data structures, programmodules, or other data in a modulated data signal, such as a carrierwave or other transport mechanism, and include any information deliverymedia.

As stated above, a number of program modules and data files may bestored in system memory 304, including operating system 306. Whileexecuting on main processing unit 302, programming modules may performprocesses including, for example, one or more stages of method 600 asdescribed below with reference to FIG. 6. The aforementioned method 600is an example, and main processing unit 302 may perform other processes.Other programming modules that may be used in accordance withembodiments of the present invention may include electronic mail andcontacts applications, word processing applications, spreadsheetapplications, database applications, slide presentation applications,drawing or computer-aided application programs, etc.

FIG. 4 illustrates an exemplary communications circuit 400 within thecommunications network 100 that may be tested using the method 600consistent with an embodiment of the invention for circuit testing.Circuit 400 is an exemplary communications circuit connecting a customerto an Inter Exchange Carrier (IEC) 402 for a communications company. TheIEC 402 may be connected to the CO 104. The CO 104 may includeadditional circuitry to facilitate communications by the customer, suchas digital access cross-connect system (DACS) 404 and subscriber linemultiplexer 116 which includes one or more subscriber line card(s) 118(FIG. 1). Circuit 400 may include additional COs, such as CO 420 and CO430. CO 420 and CO 430 may also utilize additional circuitry asdescribed above with respect to CO 104 to facilitate communications bythe customer. In addition, one or more COs, for example CO 420, mayinclude a test point 414 for testing and troubleshooting circuitsbetween the IEC 402 and the customer. The circuit 400 may also include aremote termination/high bit-rate data subscriber line (RT/HDSL) 440 anda network user interface (NIU) 450.

FIG. 5 depicts an exemplary test system 500 consistent with anembodiment of the invention for circuit testing. The test system 500includes a passive circuit test sub-system 502 for passively testingselected circuitry, for example, circuit 400 (FIG. 4). The passivecircuit test sub-system 502 may determine whether problems exist withinthe circuit 400 by monitoring circuit performance over a specifiedperiod. The passive circuit test sub-system 502 may obtain telemetrydata and alarm data for circuit 400 by monitoring circuit performance atone or more test points. The passive circuit test sub-system 502 mayalso generate historical performance data for the selected to furthergenerate trend data for the circuit 400. For example, the circuit 400may have generated the same alarm at the same time over the course of aweek.

The test system 500 includes an active circuit test sub-system 504actively testing selected circuitry, for example, the circuit 400. Anactive test for circuit 400 may include inputting test signals into theselected circuit at a test point near a designated portion of theselected circuit, which has been isolated for testing/troubleshooting.Active test for circuit 400 may also include physical layer testing. Thetest system 500 also includes a test system bridge 506 for transmittingpassive test data generated by the passive circuit test sub-system 502to the active circuit test sub-system 504. Accordingly, the passive testdata may be used by the active circuit test sub-system 504 to furthernarrow and isolate sections of circuit 400 that are most likely thecause of communications problems. In addition, by using passive testdata in conjunction with the active circuit test sub-system 504,additional test points within circuit 400 may be tested. Circuittroubleshooting application 320 (FIG. 3) may be used to coordinatecircuit troubleshooting using the passive circuit test sub-system 502and the active circuit test sub-system 504. The circuit troubleshootingapplication 320 may also facilitate the transmission of passive testdata from the passive circuit test sub-system 502 to the active circuittest sub-system 504. Accordingly, the active circuit test sub-system 504may utilize the passive test data to further refine isolation ofpotential problems in the selected circuit and conduct the activetesting of the selected circuit with increased speed and accuracy.

FIG. 6 is a flow chart setting forth the general stages involved in themethod 600 performed by programming modules executing on main processingunit 302 consistent with an embodiment of the invention for circuittesting. Ways to implement the stages of method 600 will be described ingreater detail below. Method 600 begins at starting block 605 andproceeds to stage 610 where test points for one or more predeterminedcircuits are selected for testing by a technician. Next at stage 615,the main processing unit 302 acquires passive testing data for one ormore predetermined circuits within communications network 100, forexample, alarm and telemetry data, from a passive circuit testingsub-system, for example, passive circuit testing sub-system 502 (FIG.5). The passive circuit testing sub-system 502 may be, for example, anIntegrated Network Controller (INC), a product of Alcatel-LucentCorporation, or any comparable product.

Next at stage 620, the main processing unit 302 analyzes the passivetesting data for the one or more predetermined circuits obtained by thepassive circuit testing sub-system 502. At stage 625, the passivecircuit testing sub-system 502 sends the passive testing data for theone or more predetermined circuits to an active circuit testingsub-system via the test system bridge, for example, active circuittesting sub-system 504 and test system bridge 506 (FIG. 5). The passivecircuit testing sub-system 502 acquires telemetry data for a circuit,acquires alarm data for a circuit, and acquires performance history datafor a circuit. The test system bridge 506 may be implemented usingsoftware, e.g. a software script, hardware, or a combination of softwareand hardware. The active circuit testing sub-system 504 may be, forexample, an Integrated Testing and Analysis System (INTAS), an exampleof which is available from Telcordia Corporation, or any comparableproduct.

At stage 630, the active circuit testing sub-system 504 segments the oneor more predetermined circuits to isolate an area of the circuitindicated as being problematic. At stage 635, the active circuit testingsub-system 504 tests the segmented circuit to determine if problemsexist at the indicated portion of the circuit. The active circuit testsfor the circuit may include stressing the indicated portion of thecircuit using a test signal between circuit elements, physical layertesting, testing of loopable devices within the circuit, and circuitisolation. At stage 640, the active circuit testing sub-system 504reports circuit test results to main processing unit 302. At stage 645,the active circuit testing sub-system 504 generates a trouble ticket foron-site manual circuit testing by a technician when required.

Generally, consistent with embodiments of the invention, program modulesmay be used. Program modules may include routines, programs, components,data structures, and other types of structures that perform particulartasks or that implement particular abstract data types. Moreover,embodiments of the invention may be practiced with other computer systemconfigurations, including hand-held devices, multiprocessor systems,microprocessor-based or programmable consumer electronics,minicomputers, mainframe computers, and the like. Embodiments of theinvention may also be practiced in distributed computing environmentswhere tasks are performed by remote processing devices that are linkedthrough a communications network. In a distributed computingenvironment, program modules may be located in both local and remotememory storage devices.

Furthermore, embodiments of the invention may be practiced in anelectrical circuit comprising discrete electronic elements, packaged orintegrated electronic chips containing logic gates, a circuit utilizinga microprocessor, or on a single chip containing electronic elements ormicroprocessors. Embodiments of the invention may also be practicedusing other technologies capable of performing logical operations suchas, for example, AND, OR, and NOT, including but not limited tomechanical, optical, fluidic, and quantum technologies. In addition,embodiments of the invention may be practiced within a general-purposecomputer or in any other circuits or systems.

Embodiments of the invention may be implemented, for example, as acomputer process (method), a computing system, or as an article ofmanufacture such as a computer program product or computer readablemedia. The computer program product may be a computer storage mediumreadable by a computer system and encoding a computer program ofinstructions for executing a computer process. Accordingly, the presentinvention may be embodied in hardware and/or in software (includingfirmware, resident software, micro-code, etc.). In other words,embodiments of the present invention may take the form of a computerprogram product on a computer-usable or computer-readable storage mediumhaving computer-usable or computer-readable program code embodied in themedium for use by or in connection with an instruction execution system.A computer-usable or computer-readable medium may be any medium that cancontain, store, communicate, or transport the program for use by or inconnection with the instruction execution system, apparatus, or device.

The computer-usable or computer-readable medium may be, for example butnot limited to, an electronic, magnetic, optical, electromagnetic,infrared, or semiconductor system, apparatus or device. More specificcomputer-readable medium examples (a non-exhaustive list) include thefollowing: an electrical connection having one or more wires, a portablecomputer diskette, a random access memory (RAM), a read-only memory(ROM), an erasable programmable read-only memory (EPROM or Flashmemory), an optical fiber, and a portable compact disc read-only memory(CD-ROM). Note that the computer-usable or computer-readable mediumcould even be paper or another suitable medium upon which the program isprinted, as the program can be electronically captured, via, forinstance, optical scanning of the paper or other medium, then compiled,interpreted, or otherwise processed in a suitable mariner, if necessary,and then stored in a computer memory.

Embodiments of the present invention, for example, are described abovewith reference to block diagrams and/or operational illustrations ofmethods, systems, and computer program products according to embodimentsof the invention. The functions/acts noted in the blocks may occur outof the order as show in any flowchart. For example, two blocks shown insuccession may in fact be executed substantially concurrently or theblocks may sometimes be executed in the reverse order, depending uponthe functionality/acts involved.

While certain embodiments of the invention have been described, otherembodiments may exist. Furthermore, although embodiments of the presentinvention have been described as being associated with data stored inmemory and other storage mediums, data can also be stored on or readfrom other types of computer-readable media, such as secondary storagedevices, like hard disks, floppy disks, or a CD-ROM, a carrier wave fromthe Internet, or other forms of RAM or ROM. Further, the disclosedmethods' stages may be modified in any manner, including by reorderingstages and/or inserting or deleting stages, without departing from theinvention.

While the specification includes examples, the scope of the invention isindicated by the following claims. Furthermore, while the specificationhas been described in language specific to structural features and/ormethodological acts, the claims are not limited to the features or actsdescribed above. Rather, the specific features and acts described aboveare disclosed as example for embodiments of the invention.

What is claimed is:
 1. A system for circuit testing, comprising: aprocessor; and a memory storing instructions, which, when executed bythe processor cause the processor to perform a method comprising:obtaining performance data acquired from a first test component for atleast one predetermined circuit in a telecommunications network, andcoordinating transfer of the obtained performance data to a second testcomponent, wherein the second test component segments the at least onepredetermined circuit into at least one portion for testing based on theperformance data obtained from the first test component and providestest signals to the at least one portion of the at least onepredetermined circuit based on the performance data obtained from thefirst test component; obtaining test response data from the at least oneportion of the at least one predetermined circuit in response to theprovided test signals; and determining whether the at least one portionof the at least one predetermined circuit is operating within predefinedoperational standards based on the obtained test response data.
 2. Thesystem of claim 1, wherein the first test component is a passive testcomponent.
 3. The system of claim 1, wherein the second test componentis an active test component.
 4. The system of claim 1, wherein theprocessor coordinates transfer of the performance data obtained from thefirst test component to the second test component via a test systembridge.
 5. The system of claim 1, wherein the performance data and thetest response data are obtained at one or more test points within the atleast one predetermined circuit.
 6. The system of claim 5, wherein theperformance data is obtained at a first set of test points, and the testresponse data is obtained at a second set of test points.
 7. The systemof claim 6, wherein the performance data is used in selecting the secondset of test points.
 8. The system of claim 1, wherein the performancedata comprises historical operation data for the at least onepredetermined circuit.
 9. The system of claim 1, wherein the performancedata is obtained prior to providing the test signals to the at least onepredetermined circuit.
 10. The system of claim 1, wherein the first testcomponent monitors operation of the at least one predetermined circuit.11. The system of claim 1, wherein the second test component maps acircuit layout for the at least one predetermined circuit.
 12. Thesystem of claim 1, wherein the second test component isolates problemswithin the at least one predetermined circuit.
 13. The system of claim1, wherein the second test component isolates problems within the atleast one predetermined circuit based on the performance data obtainedfrom the first test component.
 14. The system of claim 1, wherein thesecond test component conducts physical layer testing of the at leastone portion of the at least one predetermined circuit.
 15. The system ofclaim 1, wherein the second test component conducts testing of loopablecircuit elements within the at least one portion of the at least onepredetermined circuit.
 16. The system of claim 1, wherein the secondtest components applies the test signals between circuit elements withinthe at least one portion of the at least one predetermined circuit.